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Electron Microscopy
Scanning Electron Microscopy (SEM): Research-grade
scanning electron microscopes for high resolution, high
magnification photographs, capable of performing elemental
analysis with the Energy Dispersive X-Ray Spectrometry
(EDS) and the Wavelength Dispersive X-Ray Spectrometry
(WDS).
Equipment Particulars:
Instrument: Scanning
Electron Microscope
Manufacturer: JEOL
Model: JSM6320F &
JSM-35C
System Features:
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Imaging from 10x to 400,000x |
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Solid state backscattered electron
detector for compositional and topographic contrast
imaging |
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X-Y stage allows 50mm by 70mm movement
and accepts up to 3-inch diameter samples |
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Digital images and Polaroids available |
The SEM models JSM-6320F and JSM-35C instruments are
equipped with Kevex Energy Dispersive X-ray
Spectrometry (EDS) with Sigma Level 3 image
analysis and X-ray microanalysis software that perform
quick and easy examination of samples in the scanning
electron microscopes.
EDS System Capabilities:
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One micrometer spot analysis |
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Digital and analog line scan and X-ray
image mapping |
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Simultaneous detection of all elements
from B to U |
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Minimum detection limit of 0.2% by
weight |
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Fully quantitative results by extended
Φ-ρ-z |
The SEM model JSM-35C instrument is equipped with a
JEOL Four-Crystal Spectrometer for a more detailed Wavelength
Dispersive X-Ray Spectometry (WDS) elemental
analysis of samples in the scanning electron microscope.
WDS System Capabilities:
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One micrometer spot analysis |
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Digital and analog line scan and X-ray
image mapping |
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Simultaneous detection of all elements
from B to U |
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Minimum detection limit of 0.2% by
weight |
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Fully quantitative results by extended
Φ-ρ-z
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JEOL JSM-35C with Kevex Sigma Level 3
EDS and WDS Systems
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JEOL JSM6320F with Kevex Sigma Level 3
EDS System |
Ovonic sm
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